Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico
Author(s)
Bibliographic Information
Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico
IEEE Computer Society, c1998
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- Other Title
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1999 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
PR00325
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Note
Includes bibliographical references and index
"Sponsored by ..., The IEEE Computer Society Test Technology Technical Committee" -- cover
"IEEE Computer Society Press order number PR00325"
"IEEE order plan catalog number PR00325"
Description and Table of Contents
Description
These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.
by "Nielsen BookData"
