Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico

著者

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council
• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

書誌事項

Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c1998

• : microfiche

タイトル別名

1999 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

PR00325

注記

Includes bibliographical references and index

"Sponsored by ..., The IEEE Computer Society Test Technology Technical Committee" -- cover

"IEEE Computer Society Press order number PR00325"

"IEEE order plan catalog number PR00325"

内容説明・目次

内容説明

These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA45729951
• ISBN:
  • 076950325X
  • 0769503276
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA. ; Tokyo
• ページ数/冊数: xiii, 405 p.
• 大きさ: 23 cm