Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

Author(s)

• Chen, Philip T. C.
• Gu, Zu-Han
• Maradudin, A. A.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3784）

SPIE, 1999

• pbk.

Note

Includes bibliographical references and indexes

Details

• NCID: BA45732297
• ISBN:
  • 0819432709
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 404 p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA0022700X