Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

著者

• Chen, Philip T. C.
• Gu, Zu-Han
• Maradudin, A. A.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado

Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3784）

SPIE, 1999

• pbk.

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA45732297
• ISBN:
  • 0819432709
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 404 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X