Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Shefield, 24-27 August 1999
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書誌事項
Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Shefield, 24-27 August 1999
（Institute of Physics conference series, no. 161）
Institute of Physics Pub., c1999
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Electron Microscopy and Analysis 1999 provides an overview of recent developments and outlines opportunities for future research in electron microscopy. The book presents the wide-ranging applications of these techniques in materials science, metallurgy, and surface science. It is an authoritative reference for academics and researchers working in materials science, instrumentation, electron optics, and condensed matter physics.
目次
- Section 1 Plenary lectures: interface science - knowing more about less, M. Ruhle et al
- the refinement of oxide structures, D.A. Jefferson. (Part contents) Section 2 Interfaces and surfaces: three-dimensional atomic scale analysis of interfaces, A. Cerezo et al
- composition of grain boundaries and interfaces - a comparison of modern analytical techniques using a 300 kV FEGTEM, V.J. Keast. (Part contents) Section 3 Scanning electron microscopy: simplified aberration corrector for low-voltage SEM, S.A.M. Mentink et al
- temperature and energy dependence of SEM dopant contrast, S.L. Elliot et al
- probing nitride thin films in 3 dimensions using a variable energy electron beam, C. Trager-Cowan et al. (Part contents) Section 4 Electron crystallography: energy production in biological systems probed by electron crystallography, P.A. Bullough et al
- results of a pilot experiment on direct phase determination of diffracted beams in TEM, B.M. Mertens, P. Kruit. (Part contents) Section 5 Analytical electron microscopy: quantitative compositional imaging with energy-filtering TEM, F. Hofer et al
- application of multivariate statistical analysis to complex grain boundary microstructure, E.J.A. Chevalier, G.A. Bottom. (Part contents) Section 6 High resolution electron microscopy: HRTEM and nano-analytical study of metastable precipitates in aluminium alloy 6061, T. Epicier et al
- comprehensive characterization of a FEGTEM, A.I. Kirkland et al. (Part contents) Section 7 Advanced scanning probe techniques: magnetic force microscopy of soft magnetic films, G.P. Heydon et al
- electrons and photons - exploiting the connection, A. Howie. (Part contents) Section 8 Ceramics/carbon/composites: electron microscopy of real ceramics, W.E. Lee et al
- influence of additives on microstructural evolution of MgO-C refractories, S. Zhang et al
- comparative study of properties of DLC films by electron energy loss spectroscopy and X-ray reflectivity, V. Stolojan et al. (Part contents) Section 9 Metals/intermetallics: microstructural characterization by high resolution electron backscattered diffraction in the FEGSEM - competition for the TEM? F.J. Humphreys
- microanalysis of precipitates in Ti-A1 alloy, J.G. Zheng. (Part contents) Section 10 Catalysts/sensors/environmental materials: thin film structures formed from metallic nanoparticles - manipulation of the self-assembly process, C.J. Kiely et al
- investigation of redox-cycled Ce-Zr mixed oxides for automotive catalysts by electron microscopy, R.T. Baker et al. (Part contents) Section 11 Semiconductor/superconductors: the role of TEM in semiconductor device development and manufacture, R. Beanland
- cathodoluminescence studies in InGaN/GaN layers in the scanning electron microscope, A. Bewick et al. (Part contents).
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