Economics of design and test for electronic circuits and systems

著者

• Ambler, A.
• Abadir, M.
• Sastry, Sarma
• International Workshop on the Economics of Design and Test (1st : 1991 : Austin, Tex.)

書誌事項

Economics of design and test for electronic circuits and systems

editors, A.P. Ambler, M. Abadir, S. Sastry

（Ellis Horwood series in workshops）

E. Horwood, 1992

注記

"Papers presented at the First International Workshop on the Economics of Design and Test, held at MCC, Austin, Texas in September 1991"--Introd

Includes bibliographical references and index

• NII書誌ID(NCID): BA46044664
• ISBN:
  • 0132247674
• LCCN: 92021721
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: vi, 301 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7867
  • DC20 : 621.39/2
• 件名:
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Electronic circuit design -- Congresses
• 親書誌ID:
  • BA18807881