Annual Reliability and Maintainability Symposium : 2000 proceedings : Los Angeles, California USA 2000 January 24-27

Author(s)

• Reliability and Maintainability Symposium

Bibliographic Information

Annual Reliability and Maintainability Symposium : 2000 proceedings : Los Angeles, California USA 2000 January 24-27

Institute of Electrical and Electronics Engineers, c2000

• : soft.
• : case.
• : microfiche

Note

Includes bibliographical references and index

"IEEE catalog number: 00CH37055"

"The International Symposium on Porduct Quality & Integrity"

Details

• NCID: BA46442678
• ISBN:
  • 0780358481
  • 078035849X
  • 078035852X
• LCCN: 78132873
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Piscataway, NJ]
• Pages/Volumes: xviii, 394, 99 p.
• Size: 28 cm
• Classification:
  • NDC8 : 509.8