Arithmetic built-in self-test for embedded systems

Author(s)

• Rajski, Janusz
• Tyszer, Jerzy

Bibliographic Information

Arithmetic built-in self-test for embedded systems

Janusz Rajski, Jerzy Tyszer

Prentice Hall PTR, c1998

Note

Includes bibliographical references (p. [249]-263) and index

Details

• NCID: BA46484135
• ISBN:
  • 0137564384
• LCCN: 97030395
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Upper Saddle River, NJ
• Pages/Volumes: xii, 268 p.
• Size: 24 cm
• Classification:
  • LCC : TK7895.E42
  • DC21 : 621.39/5/0287
• Subject Headings:
  • LCSH : Embedded computer systems -- Testing
  • LCSH : Computer firmware