Microstructural investigation and analysis

著者

書誌事項

Microstructural investigation and analysis

B. Jouffrey, J. Svejcar (Editors)

(EUROMAT99, v. 4)

Wiley-Vch, 2000

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注記

DGM (Deutsche Gesellschaft für Materialkunde) is technical organiser of the EUROMAT99--Pref.

Includes bibliographical references and indexes

内容説明・目次

内容説明

Modern understanding of materials include the approach at the microscopic or nanometric level. In the best case, imaging at the atomic level is possible. These approaches are essential for instance in the exploration of interfaces, surfaces and defects in crystals. Several aspects can be explored, the microstructure, local element composition, and chemical bonds. This book presents the state-of-the-art of investigation methods of materials.

目次

  • Scanning and transmission electron microscopy
  • convergent beam electron diffraction
  • x-ray characterization
  • EELS
  • x-ray synchrotron radiation (EXAFS, XANES)
  • SIMS
  • auger microscopy
  • PIXE
  • near field microscopy.

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詳細情報

  • NII書誌ID(NCID)
    BA46611196
  • ISBN
    • 3527301216
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Weinheim ; New York
  • ページ数/冊数
    xi, 318 p.
  • 大きさ
    25 cm
  • 親書誌ID
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