Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia
著者
書誌事項
Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia
IEEE Service Center, [c1998]
- :softbound
- :microfiche
- タイトル別名
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EIA GaAs Reliability Workshop Proceedings
98EX219
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注記
"IEEE catalog number: 98EX219"--Cover p. [2]
Includes bibliographical references
内容説明・目次
内容説明
This volume presents results and developments in all phases of GaAs reliability of control applications. Topics include: qualification methodologies; reliability testing and failure mechanisms; and measurement techniques and device simulation.
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