Wire bonding in microelectronics : materials, processes, reliability, and yield

Author(s)

    • Harman, George G.

Bibliographic Information

Wire bonding in microelectronics : materials, processes, reliability, and yield

George G. Harmon

(Electronic packaging and interconnection series)

McGraw-Hill, c1997

2nd ed

Available at  / 1 libraries

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Note

Rev. ed. of: Reliability and yield problems of wire bonding in microelectronics. 1989

Includes bibliographical references and index

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