X-ray microscopy : proceedings of the 6th International Conference, Berkeley, CA, 2-6 Aug. 1999

Author(s)

• International Conference on X-ray Microscopy
• Meyer-Ilse, Werner
• Warwick, Tony
• Attwood, David T.

Bibliographic Information

X-ray microscopy : proceedings of the 6th International Conference, Berkeley, CA, 2-6 Aug. 1999

editors, Werner Meyer-Ilse, Tony Warwick, David Attwood

（AIP conference proceedings, 507）

American Institute of Physics, c2000

Note

Includes references

Details

• NCID: BA47515030
• ISBN:
  • 1563969262
• LCCN: 00101916
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Melville, NY
• Pages/Volumes: xix, 748 p.
• Size: 25 cm
• Subject Headings:
  • LCSH : X-ray microscopy -- Congresses
• Parent Bibliography ID:
  • BA00284604