Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.

著者

• Ünlü, M. Selim
• Symposium on Optical Microstructural Characterization of Semiconductors

書誌事項

Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.

editors, M. Selim Ünlü ... [et al.]

（Materials Research Society symposium proceedings, v. 588）

Materials Research Society, 2000

注記

Symposium P, "Optical Microstructural Characterization of Semiconductors," at the 1999 MRS Fall Meeting in Boston, Massachusetts

Includes bibliographical references and index

• NII書誌ID(NCID): BA47829560
• ISBN:
  • 1558994963
• LCCN: 00028177
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa.
• ページ数/冊数: xi, 333 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00013775