ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis, 14-18 November 1999, Westin Hotel, Santa Clara, California

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• EDFAS

書誌事項

ISTFA '99 : proceedings of the 25th International Symposium for Testing and Failure Analysis, 14-18 November 1999, Westin Hotel, Santa Clara, California

sponsored by EDFAS

ASM International, c1999

タイトル別名

25th Anniversary ISTFA/99

注記

Includes bibliographical references

EDFAS : Electronic Device Failure Analysis Society

詳細情報

• NII書誌ID(NCID): BA48353353
• ISBN:
  • 0871706466
• LCCN: 99075503
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, OH
• ページ数/冊数: xvii, 486 p.
• 大きさ: 28 cm
• 付属資料: CD-ROM