1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society, c1997

• :softbound

タイトル別名

97TH8319

注記

"IEEE Catalog No. 97TH8319"--verso of T.p

Includes bibliographical references

内容説明・目次

内容説明

The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics reproduced in this volume include: BIR - breaking down barriers; and shear test for adhesion measurement of small structures.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA48552666
• ISBN:
  • 0780342054
• LCCN: 97080028
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: vii, 161 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses