1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
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Bibliographic Information
1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
IEEE Electron Devices Society : IEEE Reliability Society, c1997
- :softbound
- Other Title
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97TH8319
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"IEEE Catalog No. 97TH8319"--verso of T.p
Includes bibliographical references
Description and Table of Contents
Description
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics reproduced in this volume include: BIR - breaking down barriers; and shear test for adhesion measurement of small structures.
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