1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society, c1998

• :softbound

Other Title

98TH8363

Note

"IEEE Catalog No. 98TH8363"--verso of T.p.

Includes bibliographical references

Description and Table of Contents

Description

The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.

by "Nielsen BookData"

Details

• NCID: BA48553024
• ISBN:
  • 0780348818
• LCCN: 98084868
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: vi, 140 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC21 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses