1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California

著者

• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

書誌事項

1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc

IEEE, 1998]

• :softbound

注記

"IEEE catalog number: 97TH8340"--Cover p. [2]

Includes bibliographical references

• NII書誌ID(NCID): BA48565919
• ISBN:
  • 0790800640
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Arlington, VA
• ページ数/冊数: v, 116 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.15.G3
  • DC21 : 621.3815/2
• 件名:
  • LCSH : Gallium arsenide semiconductors -- Reliability -- Congresses
  • LCSH : Bipolar transistors -- Reliability -- Congresses
  • LCSH : Accelerated life testing -- Congresses