1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California

Author(s)

• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

Bibliographic Information

1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc

IEEE, 1998]

• :softbound

Note

"IEEE catalog number: 97TH8340"--Cover p. [2]

Includes bibliographical references

Details

• NCID: BA48565919
• ISBN:
  • 0790800640
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Arlington, VA
• Pages/Volumes: v, 116 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.15.G3
  • DC21 : 621.3815/2
• Subject Headings:
  • LCSH : Gallium arsenide semiconductors -- Reliability -- Congresses
  • LCSH : Bipolar transistors -- Reliability -- Congresses
  • LCSH : Accelerated life testing -- Congresses