ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
著者
書誌事項
ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
ASM International, c1998
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注記
Includes bibliographical references
内容説明・目次
内容説明
Proceedings of a November 1998 symposium, with sections on advanced techniques in failure analysis, focused ion beam applications, military applications, ESD-induced failures, techniques in failure analysis and testing, discretes, packaging, backside analysis, and case histories. Specific subjects i
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