Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA

Author(s)

• Chen, Philip T.
• Uy, O. Manuel

Bibliographic Information

Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA

Philip T. Chen, O. Manuel Uy, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4096）

SPIE, c2000

Note

Includes index

Details

• NCID: BA4868280X
• ISBN:
  • 0819437417
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: v, 204 p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA0022700X