Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA

Author(s)

• Andrews, David L.
• 朝倉, 利光 アサクラ, トシミツ
• Jutamulia, Suganda
• Kirk, Wiley G.
• Lagally, Max G.
• Lal, Ravindra B.
• Trolinger, Jim

Bibliographic Information

Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA

David L. Andrews ... [et al.], chairs/editors ; sponsored by SPIE - The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4098）

SPIE--the International Society for Optical Engineering, c2000

Note

Includes bibliographical references and index

Details

• NCID: BA48932758
• ISBN:
  • 0819437433
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: viii, 314 p.
• Size: 28 cm
• Classification:
  • LCC : TA1750
• Subject Headings:
  • LCSH : Optoelectronic devices -- Congresses
• Parent Bibliography ID:
  • BA0022700X