Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits - International Symposium on the Physical & Failure Analysis of Integrated Circuits; Chim, Wai Kin; Radhakrishnan, M. K.; Thong, John T. L.; IEEE Singapore Section. Reliability/CPMT/EDA Chapter; IEEE Electron Devices Society; National University of Singapore. Centre for IC Failure Analysis and Reliability; Institute of Microelectronics (Institute of Electrical and Electronics Engineers, 1999)