Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
著者
書誌事項
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Institute of Electrical and Electronics Engineers, c1999
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- タイトル別名
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99TH8394
7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999
IPFA '99
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注記
"IEEE catalog number 99TH8394"--T.p. verso
"5-9 July, 1999, Orchard Hotel, Singapore"--Cover
Includes bibliographical references and index
内容説明・目次
内容説明
Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.
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