2000 IEEE International Reliability Physics Symposium proceedings : 38th annual, San Jose, California, April 10-13, 2000

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2000 IEEE International Reliability Physics Symposium proceedings : 38th annual, San Jose, California, April 10-13, 2000

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2000

• : soft.
• : case.

タイトル別名

00CH37059, 00CB37059

注記

Includes bibliographies

"IEEE Catalog No. 00CH370599"

詳細情報

• NII書誌ID(NCID): BA49095628
• ISBN:
  • 0780358600
  • 0780358619
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N. J.
• ページ数/冊数: viii, 455 p.
• 大きさ: 28 cm