Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

Author(s)

• International Test Conference
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

International Test Conference, c2000

• : soft
• : case
• : microfiche

Other Title

ITC : International Test Conference 2000 : proceedings

Note

"IEEE Catalog Number 00CH37159"--T.p. verso

Includes bibliographies and index

Details

• NCID: BA49486625
• ISBN:
  • 0780365461
  • 078036547X
  • 0780365488
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xiv, 1158 p.
• Size: 29 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses