Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

著者

• International Test Conference
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA]

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

International Test Conference, c2000

• : soft
• : case
• : microfiche

タイトル別名

ITC : International Test Conference 2000 : proceedings

注記

"IEEE Catalog Number 00CH37159"--T.p. verso

Includes bibliographies and index

• NII書誌ID(NCID): BA49486625
• ISBN:
  • 0780365461
  • 078036547X
  • 0780365488
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xiv, 1158 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses