Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA

Author(s)

• Goldstein, Dennis H.
• Chenault, David B.
• Duggin, Michael J.
• Egan, Walter G.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA

David B. Chenault, Michaek J. Duggin, Walter G. Egan, Dennis H. Goldstein, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4133）

SPIE, c2000

Details

• NCID: BA49669057
• ISBN:
  • 0819437786
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: ix, 302 p.
• Size: 28 cm
• Classification:
  • LCC : QC443
  • DC20 : 535.52/0287
• Subject Headings:
  • LCSH : Polarimetry -- Congresses
• Parent Bibliography ID:
  • BA0022700X