Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA

著者

• Kaiser, Winfried M.
• Stulen, Richard H.
• Society of Photo-optical Instrumentation Engineers

書誌事項

Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA

Winfried M. Kaiser, Richard H. Stulen chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4146）

SPIE, c2000

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA4967505X
• ISBN:
  • 0819437913
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vii, 178 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : X-ray astronomy -- Congresses
  • LCSH : X-ray optics -- Congresses
• 親書誌ID:
  • BA0022700X