Ionizing radiation effects in MOS oxides

Author(s)

• Oldham, Timothy R.

Bibliographic Information

Ionizing radiation effects in MOS oxides

Timothy R. Oldham

（International series on advances in solid state electronics and technology / founding editor: Chih-Tang Sah）

World Scientific, c1999

Note

Includes biblioraphical references

Details

• NCID: BA50325270
• ISBN:
  • 9810233264
• Country Code: si
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Singapore
• Pages/Volumes: xiv, 171 p.
• Size: 23 cm
• Parent Bibliography ID:
  • BA24779281