Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey

著者

• Semiconductor Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers, c1974

注記

"74CH0909-2C."

"Additional copies of this digest available from : IEEE Computer Society Publications Office. Long Beach, Calif."

• NII書誌ID(NCID): BA50334613
• LCCN: 75305682
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 261 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.3819/5833
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses