Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

著者

• Semiconductor Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE

IEEE Computer Society Publications Office, c1975

注記

"75CH1041-3C."

• NII書誌ID(NCID): BA5050389X
• LCCN: 75332954
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Long Beach, Calif.
• ページ数/冊数: 104 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
  • DC19 : 621.3819/5833
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Minicomputers -- Testing -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses