Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

Author(s)

• Semiconductor Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Memory, LSI, linear IC : digest of papers : 1975 Semiconductor Test Symposium, October 14-16, 1975, held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE

IEEE Computer Society Publications Office, c1975

Note

"75CH1041-3C."

Details

• NCID: BA5050389X
• LCCN: 75332954
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Long Beach, Calif.
• Pages/Volumes: 104 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC19 : 621.3819/5833
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Minicomputers -- Testing -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses