Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

Author(s)

• Semiconductor Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers, c1976

Note

"76CH1179-1C."

"Additional copies of this digest available from : IEEE Computer Society Publications Office. Long Beach, Calif."

• NCID: BA50504101
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: vi, 105 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.3819/5833
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses