Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

著者

• Semiconductor Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Memory & LSI : digest of papers, 1976 Semiconductor Test Symposium, October 19-21, 1976 held at Cherry Hill, New Jersey

sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers, c1976

注記

"76CH1179-1C."

"Additional copies of this digest available from : IEEE Computer Society Publications Office. Long Beach, Calif."

詳細情報

• NII書誌ID(NCID): BA50504101
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: vi, 105 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.3819/5833
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Integrated circuits -- Large scale integration -- Congresses