1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Service Center, c1999

• : softbound

タイトル別名

99TH8460

注記

"IEEE Catalog Number 99TH8460."

Includes bibliographical references

内容説明・目次

内容説明

This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA50629763
• ISBN:
  • 0780356497
• LCCN: 99062857
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataeay, N.J.
• ページ数/冊数: viii, 188 p.
• 大きさ: 28 cm