1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Service Center, c1999

• : softbound

Other Title

99TH8460

Note

"IEEE Catalog Number 99TH8460."

Includes bibliographical references

Details

• NCID: BA50629763
• ISBN:
  • 0780356497
• LCCN: 99062857
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataeay, N.J.
• Pages/Volumes: viii, 188 p.
• Size: 28 cm