1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Service Center, c1999

• : softbound

タイトル別名

99TH8460

注記

"IEEE Catalog Number 99TH8460."

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA50629763
• ISBN:
  • 0780356497
• LCCN: 99062857
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataeay, N.J.
• ページ数/冊数: viii, 188 p.
• 大きさ: 28 cm