Defects in SiO[2] and related dielectrics : science and technology

Author(s)

• NATO Advanced Study Institute on Defects in SiO[2] and Related Dielectrics, Science and Technology
• Pacchioni, G. (Gianfranco)
• Skuja, L. (Linards)
• Griscom, David L.

Bibliographic Information

Defects in SiO[2] and related dielectrics : science and technology

edited by G. Pacchioni, L. Skuja, D. L. Griscom

（NATO science series, Sub-series II, Mathematics, Physics and Chemistry ; vol. 2）

Kluwer Academic Publishers, c2000

• : pbk

Note

Includes bibliographical references and index

"Proceedings of the NATO Advanced Study Institute on Defects in SiO[2] and Related Dielectrics, Science and Technology, Erice, Italy, April 8-20, 2000"--T.P. verso

Details

• NCID: BA50677121
• ISBN:
  • 0792366859
  • 0792366867
• LCCN: 00048787
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Dordrecht
• Pages/Volumes: viii, 624 p.
• Size: 25 cm
• Classification:
  • LCC : QD181.S6
  • DC21 : 548/.85
• Subject Headings:
  • LCSH : Silica -- Electric properties -- Congresses
  • LCSH : Crystals -- Defects -- Congresses
• Parent Bibliography ID:
  • BA40559140