TY - BOOK AU - Teate, A. A. AU - Halder, N. C TI - Band tailings and deep defects in semiconductors PB - Scitech Publications PY - 1996 T2 - Diffusion and defect data : solid state data VL - pt. A . Defect and diffusion forum ; v. 133 EP - 149 p. UR - http://ci.nii.ac.jp/ncid/BA50737278 SN - 3908450187 ER -