1999 GaAs Reliability Workshop Proceedings, October 17, 1999, Monterey, California

Author(s)

• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

Bibliographic Information

1999 GaAs Reliability Workshop Proceedings, October 17, 1999, Monterey, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with Technical Co-Sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc

IEEE Service Center, c1999

• :softbound

Other Title

99TH8459

Note

"IEEE catalog number: 99TH8459"

Includes bibliographical references

Details

• NCID: BA50938699
• ISBN:
  • 0790801000
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ.
• Pages/Volumes: vii, 146 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.15.G3
  • DC21 : 621.3815/2
• Subject Headings:
  • LCSH : Gallium arsenide semiconductors -- Reliability -- Congresses
  • LCSH : Bipolar transistors -- Reliability -- Congresses
  • LCSH : Accelerated life testing -- Congresses