Electrical Overstress/Electrostatic Discharge Symposium proceedings, 2000, Anaheim, California, September 26-28, 2000

著者

• Electrical Overstress/Electrostatic Discharge Symposium
• EOS/ESD Association
• Institute of Electrical and Electronics Engineers
• IEEE Electron Devices Society
• IPC

書誌事項

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 2000, Anaheim, California, September 26-28, 2000

sponsored by the ESD Association in corporation with IEEE ; technically co-sponsored by the Electron Devices Society ; co-sponsored by The IPC

ESD Association, c2000

タイトル別名

EOS/ESD Symposium proceedings : EOS 22

00TH8476

注記

Includes bibliographies

"Ordering no. EOS-22"

"IEEE catalog no. 00TH8476"--T.p. verso

詳細情報

• NII書誌ID(NCID): BA51028543
• ISBN:
  • 1585370185
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 1 v. (various paging)
• 大きさ: 28 cm
• 件名:
  • LCSH : Electronic apparatus and appliances -- Protection -- Congresses
  • LCSH : Electric discharges -- Congresses
  • LCSH : Electrostatics -- Congresses