2000 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2000, September 6-8, 2000, Seattle, Washington, USA

Bibliographic Information

2000 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2000, September 6-8, 2000, Seattle, Washington, USA

sponsored by IEEE Electron Devices Society

Institute of Electrical and electronics Engineers, c2000

  • :softbound

Other Title

SISPAD 2000

00TH8502

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Note

"IEEE catalog number 00TH8502"--T.p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

The proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2000. Topics include: device simulation; quantum effects and novel devices; process simulation; lithography simulation; user interfaces and visualization; calibration; and more.

by "Nielsen BookData"

Details

  • NCID
    BA51053110
  • ISBN
    • 0780362799
  • LCCN
    00000282
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [New York]
  • Pages/Volumes
    ix, 282 p.
  • Size
    28 cm
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