2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Operations Center, c2000

• : softbound

タイトル別名

00TH8515

電子リソースにアクセスする 全1件

• Bible studies in missions;

  1899

  HathiTrust

  

注記

"IEEE Catalog No. 00TH8515."--T.p.verso

Includes bibliographical references

内容説明・目次

内容説明

A final report on the IEEE International Integrated Reliability Workshop 2000. It covers: water level; reliability; test and test approaches; identification of reliability; effects; characterization and prediction; models to show; reliability test structures; designing in reliability; and more.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA5111078X
• ISBN:
  • 0780363922
• LCCN: 00002863
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataeay, N.J.
• ページ数/冊数: vii, 199 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer scale integration -- Reliability -- Congresses