Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan

著者

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council
• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

書誌事項

Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan

IEEE Computer Society, c2000

• : case

タイトル別名

2000 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

PR00719

DFT 2000

注記

Includes bibliographical references and index

"IEEE Computer Society Press order number PR00719"

詳細情報

• NII書誌ID(NCID): BA51163946
• ISBN:
  • 0769507190
  • 0769507204
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA.
• ページ数/冊数: xii, 422 p.
• 大きさ: 23 cm