Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan

著者

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council
• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

書誌事項

Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan

IEEE Computer Society, c2000

• : case

タイトル別名

2000 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

PR00719

DFT 2000

注記

Includes bibliographical references and index

"IEEE Computer Society Press order number PR00719"

内容説明・目次

内容説明

This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA51163946
• ISBN:
  • 0769507190
  • 0769507204
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA.
• ページ数/冊数: xii, 422 p.
• 大きさ: 23 cm