{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA51232437.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA51232437#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA51232437.json"},"dc:title":[{"@value":"EMI test instrumentation and systems"}],"dcterms:alternative":["Electromagnetic interference and compatibility","EMC handbook"],"dc:creator":"by Donald R. J. White","dc:publisher":[{"@value":"Don White Consultants"}],"dcterms:extent":"1 v. (various paging)","cinii:size":"24 cm","dc:language":"eng","dc:date":"1980","cinii:ncid":"BA51232437","prism:edition":"2nd ed","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA00165918#entity","@type":"foaf:Person","foaf:name":[{"@value":"White, Donald R. J."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA009202","@type":"foaf:Organization","foaf:name":"宇宙航空研究開発機構 宇宙科学研究所 図書室","rdfs:seeAlso":{"@id":"https://opac.std.cloud.iliswave.jp/iwjs0008opc/cattab.do?sp_srh_flg=true&ncid=BA51232437"}}],"bibo:lccn":["72138444"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/72138444"}],"prism:publicationDate":["1980"],"dc:subject":["LCC:TK153","DC19:621.38/0436"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electromagnetic+interference","dc:title":"Electromagnetic interference"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA51231092#entity","dc:title":"A handbook series on electromagnetic interference and compatibility / by Donald R. J. White, v. 4","@type":"bibo:Book"}]}]}