Annual Reliability and Maintainability Symposium : 2001 proceedings : Philadelphia, Pennsylvania USA, 2001 January 22-25

著者

• Reliability and Maintainability Symposium

書誌事項

Annual Reliability and Maintainability Symposium : 2001 proceedings : Philadelphia, Pennsylvania USA, 2001 January 22-25

Institute of Electrical and Electronics Engineers, c2001

• : soft.
• : microfiche

タイトル別名

01CH37179

注記

Includes bibliographical references and index

"IEEE catalog number: 01CH37179" -- T. p. verso

"The International Symposium on Product Quality & Integrity"

内容説明・目次

内容説明

This text covers topics such as: techniques and applications for use of FTA, FMEA, FMECA; R&M in space and aircraft practical reliability engineering and management; reliability prediction; applications; and successful approaches to difficult accelerated life testing.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA51695490
• ISBN:
  • 0780366158
  • 0780366166
• LCCN: 78132873
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xx, 436, 95 p.
• 大きさ: 28 cm
• 分類:
  • NDC8 : 509.8