X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California

Author(s)

• Fineschi, Silvano
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California

Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2517）

SPIE, c1995

Note

Includes bibliographic references and author index

Details

• NCID: BA51736703
• ISBN:
  • 0819418765
• LCCN: 95068531
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 284 p.
• Size: 28 cm
• Classification:
  • LCC : QC482.S6
• Subject Headings:
  • LCSH : X-ray spectroscopy -- Congresses
  • LCSH : Ultraviolet spectroscopy -- Congresses
  • LCSH : Astronomical spectroscopy -- Congresses
  • LCSH : Polarimetry -- Congresses
• Parent Bibliography ID:
  • BA0022700X