X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California

著者

• Fineschi, Silvano
• Society of Photo-optical Instrumentation Engineers

書誌事項

X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California

Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 2517）

SPIE, c1995

注記

Includes bibliographic references and author index

• NII書誌ID(NCID): BA51736703
• ISBN:
  • 0819418765
• LCCN: 95068531
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 284 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC482.S6
• 件名:
  • LCSH : X-ray spectroscopy -- Congresses
  • LCSH : Ultraviolet spectroscopy -- Congresses
  • LCSH : Astronomical spectroscopy -- Congresses
  • LCSH : Polarimetry -- Congresses
• 親書誌ID:
  • BA0022700X