2001 IEEE International Reliability Physics Symposium proceedings : 39th annual, Orlando, Florida・April 30-May 3, 2001

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2001 IEEE International Reliability Physics Symposium proceedings : 39th annual, Orlando, Florida・April 30-May 3, 2001

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2001

• : soft.

タイトル別名

01CH37167

注記

Includes bibliographical references

"IEEE Catalog No. 00CH37167" -- T. p.

内容説明・目次

内容説明

Based on a reliability physics symposium, this CD-ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA52526692
• ISBN:
  • 0780365879
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: x, 464 p.
• 大きさ: 28 cm