Probabilistic methods in fatigue and fracture

Author(s)

Bibliographic Information

Probabilistic methods in fatigue and fracture

edited by A.B.O. Soboyejo, I.R. Orisamolu, W.O. Soboyejo

(Key engineering materials, v. 200)

Trans Tech Pub., c2001

Available at  / 3 libraries

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Note

Includes bibliographical references and indexes

Description and Table of Contents

Description

Volume is indexed by Thomson Reuters CPCI-S (WoS). The present book presents an in-depth report on probabilistic methods used to study fatigue and fracture of engineering materials. It is divided into three sections: fatigue; reliability modeling; and statistical methods. The book will serve as a useful new reference on probabilistic methods in fatigue and fracture. It should be of interest to researchers and engineers in industry and academia.

Table of Contents

Statistical Modeling of Microstructural Effects on Fatigue Behavior of / Titanium Alloys A Probabilistic Framework for the Modeling of Fatigue in a Lamellar XDTM1 Gamma Titanium Aluminide Alloy Probabilistic Fatigue Damage Assessment for Short Crack Growth Probabilistic Modeling of Fatigue Crack Growth in Ti-6Al-4V Cautionary Aspects of Applied Probabilistics Life Prediction - The Need for a Mechanistically Based Probability Approach Reliability High Cycle Fatigue Design of Gas Turbine Blading System Using Probabilistic Goodman Diagram A Statistical Model for the Prediction of Brittle Fracture Probabilistic Approaches to the Prediction of the Effects of Multiple Parameters on the Mechanical Properties of Gamma-Based Titanium Aluminides Time-Dependent Reliability of Ceramic Components under Transient Loads Deformation and Failure in Stochastic Fibrous Networks: Scale, Dimension and Application

by "Nielsen BookData"

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Details

  • NCID
    BA52539490
  • ISBN
    • 0878498729
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Uetikon-Zuerich
  • Pages/Volumes
    viii, 250 p
  • Size
    25 cm
  • Parent Bibliography ID
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