ICMTS 2001, proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, March 19-22, 2001, Kobe, Japan

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 2001, proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, March 19-22, 2001, Kobe, Japan

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c2001

タイトル別名

01CH37153

注記

"IEEE catalog number: 01CH37153" -- T. p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA53004171
• ISBN:
  • 0780365119
• LCCN: 00105649
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: x, 271 p.
• 大きさ: 30 cm